SA8000
SA8000
Parameter Analyzer
Semight SA8000 is a versatile, highly integrated parameter analyzer designed for efficient and precise device characterization.
The system offers a comprehensive suite of measurement capabilities, including standard DC I-V and C-V characterization, as well as high-precision transient pulse testing. With its exceptional measurement stability and high data reproducibility, the SA8000 provides a thorough and reliable parameter analysis solution for even the most complex devices.
Features
A High-end Test Platform
Sub-fA current resolution
Ultra-low Current Detection
0.1 fA（10-16 A）current measurement resolution
Fully Integrated Multi-dimensional Testing Capabilities
Flexible combinations of DC IV, CV, and fast-pulse measurement units
No-code Quick Test Mode
Quick characterization of device curves or key parameters
Functions and Advantages
Full-function / High-precision Test and Measurement
HPSMU Source/Monitor Resolution （100nV/1fA）
HRSMU Source/Monitor Accuracy （100nV/0.1fA）
HV-SPGU Ultra-fast Pulse and Transient I-V Measurement (Rise/Fall time, 20ns)
WGFMU Arbitrary Lattice Waveform Generation (ALWG) and Fast Measurement (Fast I/V, 500MSa/s)
MFCMU Multi-Frequency Capacitance Measurement (10MHz)
SemiExpert Professional Software
Switch Matrix Support（Switch）
Prober Control Support (Prober)
Open Algorithm Library (Python)
Real-time Charting (Chart)
Optional Modules
| Module | Module Name | Slot Occupied | Main Measurements | Key Specifications |
| S2016C-SA | High Power Source Measure Unit | 1 |
DC I-V
Pulsed I-V
|
Up to 200 V / 1 A (3 A Pulsed)
Min 1 fA / 100 nV resolution
|
| S2017C-SA | High Resolution Source Measure Unit | 1 |
DC I-V
Pulsed I-V
|
Up to 200 V / 1 A
Min 1 fA / 100 nV resolution
Optional PSU 0.1 fA and IV/CV switching
|
| Z4005C-SA | Multi-Frequency Capacitance Measurement Unit | 2 |
AC Impedance
C-V, C-f, C-t
|
20 Hz to 2 MHz frequency range
40 V built-in DC bias
|
| S3023P-SA | Semiconductor Pulse Generator Unit | 2 |
2-Level/3-Level Pulse
ALWG
|
Up to ±40 V high voltage output
Minimum Pulse Width 20 ns
|
| S3033C-SA | Waveform Generator and Fast Measurement Unit | 3 |
PG/Fast IV
ALWG
Transient Waveform Capture
|
2 ns programmable resolution for waveform generation
500 MSa/s simultaneous high-speed measurement
20 V peak-to-peak output
|
Typical Applications
| Category | Application Tests |
| CMOS Transistor | Id-Vg, Id-Vd, Vth, Breakdown, Capacitance, Self-heating reduction, etc. |
| Bipolar Junction Transistor (BJT) | Ic-Vc, Diode, Gummel plot, Breakdown, hFE, Capacitance, etc. |
| Discrete Device | Id-Vg, Id-Vd, Ic-Vc, Diode, etc. |
| Memory | Vth, Capacitance, Endurance test, etc. |
| Power Device | Pulsed Id-Vg, Pulsed Id-Vd, Breakdown, etc. |
| Nano Device | Resistance, Id-Vg, Id-Vd, Ic-Vc, etc. |
| Reliability Test | NBTI/PBTI, Charge pumping, Electromigration, Hot Carrier Injection, V-Ramp, J-Ramp, TDDB, etc. |