We participated as a speaker at “Accelerating Semiconductor Validation: From Reliability to Root Cause Analysis”, a seminar hosted by Integrated Service Technology Inc. (iST).
Our sharing session focused on “Life Cycle of Semiconductor Validation”, highlighting our core technologies in Thermal Forcing Systems, Contact Resistance (CRES) Testers, and Test Contact Cleaning.
This seminar provided an opportunity to exchange knowledge, connect with industry professionals, and discuss approaches to semiconductor testing and validation.
We thank iST for inviting us to share our insights and contribute to industry knowledge exchange.
