MTP8104
MTP8104
800G Quad-Port Optical Transceiver Tester
Semight MTP8104 is a comprehensive Bit Error Rate Analysis system which integrates multi-channel Bit Error Rate Tester, multi-port MCBs to host optical transceiver, and multi-channel independent temperature control units, making it ideal for mass-produced testing of high-speed 400G/800G optical transceiver across various ambient thermal cycle settings.
Features
Flexible Application
Wide Data Rate Range: 24.33~56.4 GBaud
Independent Control: Each channel can be independently configured with NRZ/PAM4, amplitude and equalization
Comprehensive Capabilities
Supports PCS hardware layer’s FEC error correction analyzer
Supports ultra-fast and high-precision BER sampling (<10ms)
Excellent Signal Quality
Rapid rise and fall time, low intrinsic jitter
Rich Test Patterns
PRBS7~31Q; SSPRQ /JP03A /JP03B /LIN /Square wave/Custom defined patterns, etc.
High Efficiency
Low cost and high efficient three-temperature cycling solution with TEC
Rich Accessories
Low maintenance costs like easy-replaceable MCBs
Cost-effective
Convenient configuration & replacement of accessories, which significantly reduces the overall testing cost
Fully Match ATE Application Scenarios
With powerful and flexible database management capabilities, it aids in the in-depth analysis of data for research and development purposes
Functions and Advantages
Multi-host Parallel Travel Control, More Flexible ATE Multi-threaded Task Processing
It supports mixed parallel testing of different types of modules, and supports testing OSFP/QSFP-DD/QSFP112/QSFP56 modules
Scientific Design: Double-sided TEC+ Water Cooler to Achieve Stronger Temperature Circulation Efficiency
Ramp time: ~2 min
Temperature control range: -5°C~ +75°C
Accurate temperature control: ±1°C
Temperature test: DMI temperature of the module
Power consumption of the module under test: 15W/module
Number of modules under test: 4 QSFP-DD modules with parallel temperature control
Integrated Optical Port Error Analyzer (BERT), MCB, and TEC Temperature Cycle Control Unit
It can be applied to the bit error performance and eye diagram quality test of 400G/800G optical modules in high and low temperature environments.
It supports QSFP-DD, OSFP, QSFP112 and other optical module packaging forms.
Easy to Use & High Cost-Effectiveness
Status monitoring of TEC, MCB connector, and crimping box
Separable design of MCB, which can be easily replaced while mating cycles life expired
| 800G Test Solution | ||
| Model | DUT | Quantity |
| MTP8104 | 400G/800G OSFP | 4 |
| 400G/800G QSFP-DD | 4 | |
TX Specification
| Type | Item | Description |
| Pattern Generator Specification | Output | Differential PAM4/NRZ |
| Quantity of DUT in Parallel | 4 | |
| Terminal | AC Coupling | |
| Output Impedance | 100 Ω ± 10% | |
| Pattern | PRBS 7/9/11/13/15/23/31. PRBS7~31Q
SSPRQ, JP03A, JP03B, LIN, Square wave, Custom Defined pattern, etc. |
|
| Symbol Data Rate [1] (GBaud) | 24.33/24.8832/25/25.78125/26.5625/27.89/27.95/28.05/28.125 /28.2/48.66/49.7664/51.5625/53.125/56/56.25/56.4 |
|
| Frequency | ±50 ppm (typical) | |
| Output Amplitude (Differential) | 750 mVp-p (typical) [2] | |
| Rise Time [3] (20–80%) | <10 ps (typical) | |
| Fall Time [3] (20–80%) | <10 ps (typical) | |
| Random Jitter [4] | <350 fs (typical) | |
| Trigger and Clock Specification | Clock Output Amplitude | >300 mVp-p |
| Output Type | AC Coupled, Single-ended | |
| Div Ratio (Adjustable) | 4/8/16/32 | |
| Trigger Output | Support independent clock output for each port |
[1] Option can be added to support expansion the rates <48G.
[2] Net measurement value at the transmitter’s end, default pre-emphasis/de-emphasis parameters.
[3] Tested with 53.125 Gbps NRZ signal.
[4] Tested with/after Jitter separation.
RX Specification
| Type | Item | Description |
| Error Detector Specification | Input | Differential PAM4 /NRZ |
| Terminal | AC Coupled | |
| Input Impedance | 100 Ω ±10% | |
| Input Range (Differential) [1] | 150 ~ 750 mVp-p (typical) | |
| RSSI (Differential) [1] | 150 mVp-p (typical) | |
| Pattern | PRBS 7/9/11/13/15/23/31, PRBS7~31Q, SSPRQ | |
| Symbol Rate (Gbaud) [2] | 24.33/24.8832/25/25.78125/26.5625/27.89/27.95/28.05/28.125 /28.2/48.66/49.7664/51.5625/53.125/56/56.25/56.4 |
|
| Clock Mode | Built-in Clock Recovery | |
| Sync | Auto Sync (Level/Phase) |
[1] Excessively high output amplitude of the device under test may damage the receiver.
[2] Option can be added to support expansion the rates <48G.
Optical Transceiver Testing Specification
| Type | Item | Description |
| TC Specification [1][2] | TC Mode | Contact TEC temperature control |
| TC Range | -5 ~＋85 ℃ [3] | |
| Stability | ±1 ℃ [4] | |
| Accuracy | ±0.1 ℃ | |
| Vcc Bias Tuner | BIAS Range | 2.85～3.67 V |
| Step | 1 mV[5] |
[1]The TC efficiency might fluctuate due to factors such as the ambient temperature, the power consumption of various transceivers, the location of heat sources, and the output power of the chiller
[2]Due to condensation by long-term low temperature use, the inner space should be circulated with dry and clean air, and periodically heated for drying
[3]Test environment: Room temperature of 25℃, 15W module placed in a closed space to reduce heat exchange with outside; Feedbacked by DMI temperature
[4]Perform repeat measurements of the temperature difference between the set temperature and case temperature
[5] Measured in the Semight Laboratory test environment (constant temperature 25°C, constant load 12W)