CT6201-DC
CT6201-DC
CoC Test System
Semight fully automated CoC Test System CT6201-DC offers convenience and efficiency that make it the optimal choice for CoC mass production. It uses the same testing fixtures with BI6201, simplifying the chip loading and unloading process and eliminating potential EOS/ESD risks during the process. The patented optical power coupling system design ensures the speed and repeatability of optical coupling and spectrum testing. With its unique dual testing stage design, each stage features independent temperature control, reducing waiting time for heating and cooling. Dual-sided CoC fixtures make the parallel test feasible to improve production efficiency significantly.
Features
CoC & Probe Card Stay Attached
During the burn-in and testing process, the CoC and probe card stay attached to minimize damage caused by the probe to the CoC
Temperature Range
Standard: 25°C to 100°C
Low temperature optional: -10°C to 100°C
High Testing Efficiency
CoC testing time < 7.5s
Automatic Loading & Unloading Fixture
Holds up to 6 fishbone fixtures with one magazine
High Testing Accuracy
Threshold current repeatability: ＜±1%
Power repeatability: <±1%
Wavelength repeatability: <±0.15 nm
SMSR repeatability: <5 dB
Self-developed SMU
Integrating Semight self-developed precision SMU by default
Software Functions
All test results, statuses, and abnormal records are automatically saved to the database efficiently and traceable
| Items | Description |
| DUT | CoC |
| Fixture | Using same fixture with Semight CoC BI system |
| – Standard 48 pcs chip long fixture – Standard 32 pcs chip short fixture |
|
| Fixture Loading/Unloading | Automatic loading and unloading fixture |
| Fixture ID Scan | Automatic Fixture Barcode scanning |
| Parallel Testing | CoC fixture double side parallel test |
| Standard Sample Control | The software supports standard sample management functions. If a standard sample is tested on the current system beyond the configured time period, the system will automatically generate an alert. |
| System Management | The software supports test system management functions. If the same fixture is used under testing on different test system before and after burn-in, the system will automatically generate an alert. |
| Test Configuration Control | The software supports test configuration management and control, including test instrument, test algorithm, test sequence, test result judgment, etc. |
| Test Data | Supports customer customization and MES-related requirements |