Dynamic Temperature Forcing System

CTS0303M, CTS0303C ,CTS0303D, CTS0437

Dynamic Temperature Forcing System is designed for precise temperature control of low to high-power devices, enabling rapid temperature transitions across a wide operating range of lowest to -55°C and up to 150°C. With exceptional cooling and heating capacity, ensuring accurate thermal management for various IC package types. Optimized for Tcase and Tjmax testing, it seamlessly integrates with bench handlers for automated testing, making it an ideal solution for demanding test environments.

Dynamic Temperature
Forcing System

Advanced Temperature and Force Testing for Semiconductor Validation

Controlled temperature and contact force for reliable evaluation of device under test (DUT) across varying thermal conditions. Designed for semiconductor testing, the system supports device validation and temperature characterization through consistent thermal contact.

Contacthings thermal head
Thermal head anatomy Water Block, Heater Pad, Pedestal and DUT separate upward as you scroll. DEVICE DUT 3x3 to 70x70mm Device under test CONTACT Pedestal 2000N Max Product Specific Thermal & Force Contact Surface HEATING Heater Pad 150°C Max Controlled heat input COOLING Water Block -55°C Min Cooling module interface

Dynamic Temperature
Forcing System

Advanced Temperature and Force Testing for Semiconductor Validation

Controlled temperature and contact force for reliable evaluation of device under test (DUT) across varying thermal conditions. Designed for semiconductor testing, the system supports device validation and temperature characterization through consistent thermal contact.

Contacthings thermal head

Water Block

-55°C Min

Heater Pad

150°C Max

Pedestal

2000N Max

DUT

3x3 to 70x70mm

First of Kind (FoK)

In Thermal, Force Control & MonitoringAdvancing Testing from IC Design Lab to Semiconductor Production

(FoK)
First of Kind

In Thermal, Force Control & MonitoringAdvancing Testing from IC Design Lab to Semiconductor Production
Confidence Through Every Test
Advanced temperature and force control with real-time monitoring delivers consistent test conditions for high-performance semiconductor validation
Confidence Through Every Test
Advanced temperature and force control with real-time monitoring delivers consistent test conditions for high-performance semiconductor validation
Why Choose Us?Precision, Flexibility and Sustainability in Every Test
Artboard 1 copy

Dynamic Force Control

Dynamic control over contact force maintains consistent DUT contact for stable, repeatable thermal testing

universal 2

Universal

Versatile thermal head configurations simplify testing across different device packages and setups

3 monitor

Real-Time Monitoring

Live temperature and force readings help detect deviations during testing for timely adjustments

4 scale

Scalability

Expandable setups support growing demands from device validation to production testing

cost 5

Cost Efficiency

Configurations based on actual testing needs help control upfront investment and ongoing operating costs

Why Choose Us?Precision, Flexibility and Sustainability in Every Test
Artboard 1 copy

Dynamic Force Control

Dynamic control over contact force maintains consistent DUT contact for stable, repeatable thermal testing

universal 2

Universal

Versatile thermal head configurations simplify testing across different device packages and setups

3 monitor

Real-Time Monitoring

Live temperature and force readings help detect deviations during testing for timely adjustments

4 scale

Scalability

Expandable setups support growing demands from device validation to production testing

cost 5

Cost Efficiency

Configurations based on actual testing needs help control upfront investment and ongoing operating costs

Dynamic mUCV delivers precise temperature and force control for semiconductor testing

Ready for Your Test Environment
From standalone evaluation to integrated handling, configurable setups support different device packages, testing workflows and production requirements
Ready for Your Test Environment
From standalone evaluation to integrated handling, configurable setups support different device packages, testing workflows and production requirements

Dynamic mUCV delivers precise temperature and force control for semiconductor testing

Find Your Thermal Testing Setup

Find Your Thermal Testing Setup

Configured for Your Test Requirements

Match your test requirements with advanced features and high performance for confidence in every test

Auto

Automated Dynamic mUCV

Temperature and force control with benchtop handling CTS0437

Benchtop Handler
Dynamic mUCV
Dynamic mUCV
CTS Chiller
CTS Chiller
Thermal Controller with I/O
Thermal Controller with I/O
View solution   ↗
Semi Auto

Dynamic mUCV

For characterization board testing CTS0303M

Dynamic mUCV
CTS Chiller
CTS Chiller
Thermal Controller with I/O
Thermal Controller with I/O
View solution   ↗
Semi Auto

mUCV

For characterization board testing CTS0303C

mUCV
CTS Chiller
CTS Chiller
Thermal Controller with I/O
Thermal Controller with I/O
View solution   ↗
Manual

mUDV

For development vehicle board testing CTS0303D

mUDV
CTS Chiller
CTS Chiller
Thermal Controller
Thermal Controller
View solution   ↗

Configured for Your Test Requirements

Match your test requirements with advanced features and high performance for confidence in every test

Auto

Automated Dynamic mUCV

Temperature and force control with benchtop handling CTS0437

Benchtop Handler
Dynamic mUCV
Dynamic mUCV
CTS Chiller
CTS Chiller
Thermal Controller with I/O
Thermal Controller with I/O
View solution  
Semi Auto

Dynamic mUCV

For characterization board testing CTS0303M

Dynamic mUCV
CTS Chiller
CTS Chiller
Thermal Controller with I/O
Thermal Controller with I/O
View solution  
Semi Auto

mUCV

For characterization board testing CTS0303C

mUCV
CTS Chiller
CTS Chiller
Thermal Controller with I/O
Thermal Controller with I/O
View solution  
Manual

mUDV

For development vehicle board testing CTS0303D

mUDV
CTS Chiller
CTS Chiller
Thermal Controller
Thermal Controller
View solution  

Temperature and Force for Demanding Test

Temperature and Force for Demanding Test

Extreme Performance for Thermal Testing

Ultra performance temperature and force control for demanding semiconductor testing and validation

Dynamic Temperature Forcing System

Lowest

-55°C

Extreme Low temperatures achieved
with thermo chillers.

Up to

150°C

Controlled heating for high temperature
device validation.

Specifications
Temperature Range -55°C to 150°C​
Accuracy: 2°C with no load (T/C Accuracy is 1°C)​
Stability: 1°C under controlled conditions​
Tolerance: ± 3°C at steady state​
Temperature Ramp rate heating: >0.85°C/sec
Transition Rates
Ramp rate cooling: >0.60°C/sec
Contact Force
100kg (max)
DUT Dimensions
3x3mm to 70x70mm
Communication USB / RS232 / RS485

 

Dimension & Weight
Thermal Head L125mm x W72mm x H30mm / 7kg
Thermal Controller L400mm x W130mm x H185mm / 10kg
Chiller L450mm x W700mm x H690mm / 110kg

 

System Requirements
System Protection – Over-Voltage / Over-Current / Surge Protection​
– Over-Temperature Protection​
– Electric Leakage Protection
Power Requirements 220V, 50Hz, Single Phase
110V*, 60Hz (Optional)
Operating Temperature 22°C -30°C

Lowest

-55°C

Extreme Low temperatures achieved
with thermo chillers.

Up to

150°C

Controlled heating for high temperature
device validation.

Dynamic Temperature Forcing System
Specifications
Temperature Range -55°C to 150°C​
Accuracy: 2°C with no load (T/C Accuracy is 1°C)​
Stability: 1°C under controlled conditions​
Tolerance: ± 3°C at steady state​
Temperature Ramp rate heating: >0.85°C/sec
Transition Rates
Ramp rate cooling: >0.60°C/sec
Contact Force
100kg (max)
DUT Dimensions
3x3mm to 70x70mm
Communication USB / RS232 / RS485

 

Dimension & Weight
Thermal Head L125mm x W72mm x H30mm / 7kg
Thermal Controller L400mm x W130mm x H185mm / 10kg
Chiller L450mm x W700mm x H690mm / 110kg

 

System Requirements
System Protection – Over-Voltage / Over-Current / Surge Protection​
– Over-Temperature Protection​
– Electric Leakage Protection
Power Requirements 220V, 50Hz, Single Phase
110V*, 60Hz (Optional)
Operating Temperature 22°C -30°C

Thermo Chillers for Extreme 55

Compressor cooling with PID control for consistent performance under extreme thermal conditions

System Overview

ArcticFlow system overview
AeroFlow system overview
Water Cooled

ArcticFlow

Water Cooled Thermo Chiller

ArcticFlow thermo chiller

−72°C to −53°C
300W cooling capacity at −72°C
±1°C temperature stability

View Specifications  
Air Cooled

AeroFlow

Air Cooled Thermo Chiller

AeroFlow thermo chiller

−72°C to −53°C
300W cooling capacity at −72°C
±1°C temperature stability

View Specifications  

Thermo Chillers for Extreme 55

Compressor cooling with PID control for consistent performance under extreme thermal conditions

System Overview

ArcticFlow
ArcticFlow system overview
AeroFlow system overview
Water Cooled

ArcticFlow

Water Cooled Thermo Chiller

ArcticFlow thermo chiller

−72°C to −53°C
300W cooling capacity at −72°C
±1°C temperature stability

View Specifications  
Air Cooled

AeroFlow

Air Cooled Thermo Chiller

AeroFlow thermo chiller

−72°C to −53°C
300W cooling capacity at −72°C
±1°C temperature stability

View Specifications  

Explore More Thermal Testing Options

Explore More Thermal Testing Options

Core Innovation for Device Validation

Advanced temperature and force control for consistent semiconductor characterization and testing

Dynamic Temperature Forcing System

Lowest

-40°C

Dynamic Low temperatures achieved
with CTS chiller.

Up to

150°C

Controlled heating for high temperature
device validation.

Specifications
Temperature Range -40°C to 150°C​
Accuracy: 2°C with no load (T/C Accuracy is 1°C)​
Stability: 1°C under controlled conditions​
Tolerance: ± 3°C at steady state​
Temperature Ramp rate heating: >0.85°C/sec
Transition Rates
Ramp rate cooling: >0.60°C/sec
Contact Force
100kg (max)
DUT Dimensions
3x3mm to 70x70mm
Communication USB / RS232 / RS485

 

Dimension & Weight
Thermal Head L125mm x W72mm x H30mm / 7kg
Thermal Controller L400mm x W130mm x H185mm / 10kg
Chiller L450mm x W700mm x H690mm / 110kg

 

System Requirements
System Protection – Over-Voltage / Over-Current / Surge Protection​
– Over-Temperature Protection​
– Electric Leakage Protection
Power Requirements 220V, 50Hz, Single Phase
110V*, 60Hz (Optional)
Operating Temperature 22°C -30°C

Lowest

-40°C

Dynamic Low temperatures achieved
with CTS chiller.

Up to

150°C

Controlled heating for high temperature
device validation.

Dynamic Temperature Forcing System
Specifications
Temperature Range -40°C to 150°C​
Accuracy: 2°C with no load (T/C Accuracy is 1°C)​
Stability: 1°C under controlled conditions​
Tolerance: ± 3°C at steady state​
Temperature Ramp rate heating: >0.85°C/sec
Transition Rates
Ramp rate cooling: >0.60°C/sec
Contact Force
100kg (max)
DUT Dimensions
3x3mm to 70x70mm
Communication USB / RS232 / RS485

 

Dimension & Weight
Thermal Head L125mm x W72mm x H30mm / 7kg
Thermal Controller L400mm x W130mm x H185mm / 10kg
Chiller L450mm x W700mm x H690mm / 110kg

 

System Requirements
System Protection – Over-Voltage / Over-Current / Surge Protection​
– Over-Temperature Protection​
– Electric Leakage Protection
Power Requirements 220V, 50Hz, Single Phase
110V*, 60Hz (Optional)
Operating Temperature 22°C -30°C

CTS Chiller for Dynamic 40

Compressor cooling with intelligent PID control, high stability and a compact under table design

System Overview

mUCV / mUDV Flowchart

Dynamic 40 system overview
PID Control

CTS Chiller

Chiller for Dynamic 40

CTS Chiller for Dynamic 40
CTS Chiller
Thermal Controller with I/O for mUCV
Thermal Controller with I/O
mUCV
Thermal Controller for mUDV
Thermal Controller
mUDV

CTS Chiller for Dynamic 40

Compressor cooling with intelligent PID control, high stability and a compact under table design

System Overview

mUCV / mUDV Flowchart

Dynamic 40 system overview
PID Control

CTS Chiller

Chiller for Dynamic 40

CTS Chiller for Dynamic 40
CTS Chiller
Thermal Controller with I/O for mUCV
Thermal Controller with I/O
mUCV
Thermal Controller for mUDV
Thermal Controller
mUDV

Looking to Configure Your
Testing Setup?

Discuss your temperature, force and integration requirements with our team

Thermal head

Looking to Configure
Your Testing Setup?

Discuss your temperature, force and integration requirements with our team

Thermal head