Titan1000 Probe Pin
Titan1000 (T1K) Probe Pin is a high-performance semiconductor test probe designed for wafer probing, IC testing, and test socket applications. Featuring proprietary Titan1000 Alloy technology, it delivers superior hardness, long service life, stable electrical contact, and reduced abrasion for reliable performance in demanding semiconductor test environments.
Titan 1K Special Alloy Probe Pin
Micro fabricated probe pin technology for accurate, repeatable testing.
Titan 1K Special Alloy Probe Pin
Micro fabricated probe pin technology for accurate, repeatable testing.
Titan1000 Probe PinAnatomy
Top Plunger
• Material : Titan 1000 Alloy
• Plating : Gold Plated
Spring
• Material : Music Wire / SUS Wire / BeCu Wire
• Plating : Gold Plated
Bottom Plunger
• Material : Pd Alloy / BeCu / SK-4F
• Plating : Gold Plated
Titan1000 Probe PinAnatomy
Top Plunger
Material: Titan 1000 Alloy
Plating: Gold Plated
Spring
Material: Music Wire / SUS Wire / BeCu Wire
Plating: Gold Plated
Bottom Plunger
Material: Pd Alloy / BeCu / SK-4F
Plating: Gold Plated
Why choose Titan1000 pin?
1. High Hardness
Hv : Vickers Hardness
2. Less Abrasion
T1k Pin
Pd Alloy
BeCu
Initial
After 1000K
Real Image
Abrasion Loss
18μm
decrease
decrease
41μm
decrease
decrease
64μm
decrease
decrease
3. Less Resistance Gap. High Stability Resistance.
Normal Pin & T1K Pin Comparison
Initial
Image After 300K
LTT Image EDS
Image After 300K
LTT Image EDS
Normal & Pd Alloy Pin
Titan 1000 Pin
Initial
Image After 300K
LTT Image EDS
Image After 300K
LTT Image EDS
Conclusion
Rapid Debris Deposition
(Rough Surface)
Anti-solder migration & less contamination
(Smooth Surface)
Product Specification
Pyramid Tip
Package Type
QFN QFP
0.35mm ~ 0.50mm
Available Pitch
50mΩ~80mΩ
Contact Resistance
1.3A ~ 2.0A
Current Carrying Capacity
-55°C ~ 150°C
Operating Temperature
Crown Tip
Package Type
BGA
0.35mm ~ 0.50mm
Available Pitch
50mΩ
Contact Resistance
1.0A ~ 2.0A
Current Carrying Capacity
-55°C ~ 150°C
Operating Temperature
Product Details
