Automated Test Equipment (ATE)
Vision Series
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FI7320 – 5S Sides Inspection Machine
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LC6300 – Flip Chip Die Bond Offset Inspection
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FI7700 – Full Function 3D Inspection
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WI2000 – LED Wafer AOI Inspection
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LI1100 – Lid Gap AOI Inspection
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XI1100 – Six-Slided Inspection Machine
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UA1000 – Under Fill AOI Inspection
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WR1000 – Wafer Internal Crack Inspection Machine
