SV4E-SLVSEC Protocol Analyzer
The SV4E-SLVSEC 16-Lane, 6.5 Gbps Protocol Analyzer from Introspect Technology is a fully integrated solution for developing, debugging, and testing image sensor and camera systems using the SLVS-EC (Scalable Low Voltage Signaling Embedded Clock) Version 2.0 protocol. Also known as JIIA EVI-001-2019, this analyzer simplifies protocol validation with an all-in-one bench setup.
Its advanced analog front-end supports high-speed validation beyond current SLVS-EC standards, while Pinetree software enables full automation and Python-based scripting for streamlined debugging and production screening. Ideal for both chip- and module-level testing, the SV4E-SLVSEC provides powerful tools for packet analysis, error detection, and payload extraction.
- Self-Contained: an all‐in‐one system enables the simplest bench environment for protocol validation applications
- Automated: leverages the full power of Python and Introspect’s award-winning software, Pinetree. Scripting capability is ideal for debug tasks and full‐fledged production screening of devices and system modules
- Future Proof: protect your investment by adopting a high-performance tool for multiple applications and across a large span of data rates
The SV4E-SLVSEC 16-Lane, 6.5 Gbps Protocol Analyzer is a highly integrated packet and protocol analyzer that enables the development, debugging, and testing of image sensor and camera systems based on the Scalable Low Voltage Signaling Embedded Clock (SLVS-EC) Version 2.0 protocol. This protocol is also referred to as the JIIA EVI-001-2019, and it was published recently by the Japan Industrial Imaging Association.
The SV4E-SLVSEC’s unique analog front-end technology provides high-confidence design validation at speeds far exceeding the latest SLVS-EC standards. Coupled with Introspect’s award-winning software environment, Pinetree, the unit includes a full suite of tools and viewers for packet analysis, error detection and payload extraction. Key applications include both chip-level level and module-level test for image sensors and high-end vision systems.
