CT6201-DC
CoC Test System
CT6201-DC is a fully automatic CoC/CoS test system. Cost effectiveness and high efficiency make it a perfect solution for CoC/CoS mass production application. It uses the same fixture as Semight BI6201 CoC/CoS burn-in system, this reduced the DUT load/unloading process to greatly eliminate EOS/ESD damage.
Special designed optical power coupling system make the optical coupling and spectrum testing very fast with excellent repeatability.
CT6201-DC have two test seats in system, they could work independently and in parallel, also could set test temperature differently and independently.
- Large temperature range and high stability – Large temperature control range：25-100 ℃ , High temperature stability：<±0.1 ℃
- High test efficiency – Dual test platform, supporting dual side parallel test, Automatic up and down fixture, reducing the complexity and error probability of human participation, Extremely high-test speed: each CoC test time is 7s
- High repeatability – Threshold current repeatability：<±0.5%, Power repeatability：<±1%, Wavelength repeatability：<±0.05 nm, SMSR Wavelength <5 dB
- High scalability – Support DC or pulse power to drive the laser, Integrated Semight instrument precision Source meter unit；
| System parameter | Chip Type | CoC/CoS |
| Fixture Type | Support the same fixture of CoC BI system | |
| Standard 48 pcs chip clamp (can be customized) | ||
| Upper and lower clamps | Automatic upper and lower clamps | |
| Fixture ID Scan | Automatic Fixture Barcode scanning | |
| Parallel Testing | CoC fixture double side parallel test | |
| Standard sample control | The software supports the standard sample control function. If the standard sample is tested on this machine for more than a time period (configurable), the system will automatically alarm | |
| Test machine control | The software supports the control function of the test machine. If the same fixture is tested on different test machines before and after aging, the software will automatically generate an alarm prompt. | |
| Test configuration control | The software supports test configuration management and control, including test instrument, test algorithm, test sequence, test result judgment, etc. | |
| Test Data | Support all test data required by users / support MES related requirements | |
| Electrical index | SMU Type | Standard Source/Measurement Unit |
| DC Current | 3 A | |
| I/V Source resolution | 10 fA/100 nV | |
| I/V Measurement resolution | 10 fA/100 nV | |
| Voltage Range | 70 V | |
| Pulse Current | 10 A | |
| EOS | No EOS (under any normal operation and use conditions) | |
| Optical index | Optical Power measurement Detector Type | Ge |
| Optical power wavelength range | 800-1700 nm | |
| Optical power measurement range | 10 μW-300 mW (Add attenuator if power by than 25 mW) | |
| Optical power measurement accuracy | <0.2 dB | |
| Spectral measurement range | Integrated Yokogawa AQ6360 or other spectrometers | |
| Spectral measurement accuracy | ||
| Optical power coupling efficiency | Coupled Power >-15dBm for all cased need to test optical spectrum | |
| Temperature control index | Temperature control method | TEC |
| Temperature Zone | 2 independent temperature control zones (dual stage） | |
| Temperature range | 25-100 ℃ | |
| Temperature change speed (heating / cooling) | 20 ℃/min | |
| Temperature Resolution | 0.01℃ | |
| Temperature Accuracy | 25~100 ℃:±0.5 ℃+1%ΔT | |
| Temperature Consistency | <±0.5℃ | |
| Temperature stability | <±0.2℃ | |
| Test parameters | Ith Repeatability | ±0.5% |
| Power Repeatability | ±1% | |
| SE Repeatability | ±2% | |
| Wavelength Repeatability | <±0.15 nm； | |
| SMSR Wavelength | <5 dB |