MEMS Probe

Our MEMS Probe Pin is engineered with advanced microelectromechanical (MEMS) precision to deliver exceptional accuracy, durability, and electrical performance in semiconductor testing. The top plunger features a new super hard alloy plating, offering superior hardness, wear resistance, and conductivity compared to conventional materials. This innovation ensures stable contact, minimal resistance variation, and a longer service life. Designed for high-frequency and fine-pitch applications, our MEMS Probe Pin provides consistent and reliable performance across both wafer-level and package-level test environments.