PB6600
SiC KGD Die Handler
Semight PB6600 KGD Die Handler can be mainly used for power chip Die-level dynamic and static test to implement the screening of chip performance indicators and improve the first pass yield of the module after packaging. The testers in the corresponding specifications can be configured by test items, test conditions and test parameters. According to customer requirements, can supports the customized development. The system supports frame ring input and output.
- Strong expandability – The handler with transport part (PB6600) is separated from the test part
- Six parallel tests – Support up to 6 test stations, different test stations support different test conditions and items
- Dynamic and static test – Static test 2000V/600A, Dynamic test 1200V/2000A
- Accurate test results – Room temperature ~ 200 ℃, accuracy＜±3°C，resolution：0.1°C
- Hard docking – Stray inductance of the dynamic test system≤50nH
- Nitrogen pressure test – The sealed cavity design is adopted for the probe card, with the nitrogen pressure monitoring function, which can maintain pressure and prevent arcing
- UPH capability ＞1400pcs – Single test station test time≤1s
Static parameter test list
| Test type | Item | Description |
| Static test parameters (more parameters according tester) |
Vds | Drain – Source Voltage |
| Vth | Gate Threshold Voltage | |
| Idss | Zero Gate Voltage Drain Current | |
| Igss | Gate-Source Leakage Current | |
| Rds(on) | Drain-Source On-State Resistance | |
| Vsd | Diode Forward Voltage |
Dynamic test parameter list
| Test type | Item | Description |
| UIS test parameters (more parameters according tester) |
Rint | Gate Input Resistence |
| Ciss | Input Capacitance | |
| Coss | Output Capacitance | |
| Crss | Reverse Transfer Capacitance | |
| Eoss | Coss Stored Energy | |
| AC Characteristics (more parameters according tester) |
Isc | Short-circuit Current |
| Td(on) | Turn-On Delay Time | |
| Tr | Rise Time | |
| Tf(off) | Turn-Off Delay Time | |
| Tf | Fall Time | |
| Eon | Turn Off Switching Energy | |
| Eoff | Fall Time | |
| Trr | Reverse Recovery Time | |
| Qrr | Reverse Recovery Charge | |
| Irrm | Peak Reverse Recovery Current |