
WAT6600
Parallel Parametric Test System
WAT6600 is a high efficiency parallel parametric test system that can quickly perform accurate DC measurements, capacitance measurements, and other high-frequency applications (such as ring oscillator measurements), flash memory tests and so on.
- Self-developed – Self-developed hardware and measurement resources, Stable supply chain, short lead time
- High output capability – Per-pin resource providing, SMU:200V max 1A max, PGU: ±20V
- Configurable Pin number – Maximum 48 Pin full kelvin
- High precision – The accuracy down to 1pA, system leakage current <500fA, Extremely low current measurement
- SECS/GEM compliance – Easy integration to customer EAP or factory automation
- Built-in Maintenance software – CAL/DIAG/PV, Fast troubleshooting and diagnostic of hardware problem, timely guarantee of tester performance
- Compatible with 48pin – 48pin 230mm-diamter probe card, Protect customer investment on probe card, low migration cost to new tester
- Compatible with mainstream probers –TEL P8XL/P12/P12XL/Precio XL, TSK UF200/UF3000/UF3000EX, etc.
System Configuration
# | Category | Sub-Category | Description |
1 | System Cabinet | Cabinet | Rack, EMO
Power Supply and Distribution Unit |
Controller | Win10 Workstation,
ptSEMIGHT software suites |
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LCR | Optional
1fF~100nF range Frequency:1KHz~1MHz |
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DMM | Optional
7 ½ display resolution |
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Signal Analyzer | Optional
9K~10M frequency range |
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PXIe Chassis | Optional
For external HV-SPGU |
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Semiconductor Pulse Generator |
Optional(S3023P) ±40V(Open), ±20V(50Ω)
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2 | Test Head | Mainframe | Configurable pins |
Pin Board | Semight S2018G:
Per-pin SMU: ±200V, ±1A, 100nV/1fA Per-pin PGU: ±20V(Open), ±10V(50Ω) |
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Aux port | Default configuration:
8 BCN Port for external Instrument |
System Functionality
Application | |
Inline E-test, BEOL WAT, WLR for advanced process | |
Test Items (typical) | |
IV/CV | Id-Vd,Id-Vg,Vth,BV,Ig,Ioff,Gm |
MIM_CAP,C & G | |
Ic-Vc,BETA,BV | |
Ron,R_tlm,Rsh_van | |
Spot,Sweep,Search | |
Kelvin & Non-Kelvin | |
Differential Voltage | |
Frequency | Ring Oscillator Frequency |
Reliability | HCI,NBTI/PBTI,TDDB, etc. |
DC | |
Resource | Semight Per-pin SMU S2018G |
Function | Spot, Sweep |
S2018G: 1fA to 1A, 100nV to 200V | |
Capacitance | |
Resource | External LCR |
Function | C/G |
Frequency | 1kHz, 10kHz, 100kHz, 1MHz |
Range | 1fF to 100nF |
DC Bias | ±40 V |
Differential Voltage | |
Resource | External DMM |
Range | 1µV to 100V |
Pulse Generation | |
Resource | Semight Per-pin PGU S2018G |
Amplitude | ±20V (Open), ±10V(50Ω) |
Frequency | 0.1Hz to 5MHz |
Pulse Width | 100ns to (Period – 100ns) |
Tr/Tf | <100ns (Typ 50ns) |
Frequency Measurement | |
Resource | External Signal Analyzer |
Frequency Range | 9K to 20M Hz |