WAT6600

Parallel Parametric Test System

WAT6600 is a high efficiency parallel parametric test system that can quickly perform accurate DC measurements, capacitance measurements, and other high-frequency applications (such as ring oscillator measurements), flash memory tests and so on.

  • Self-developed – Self-developed hardware and measurement resources, Stable supply chain, short lead time
  • High output capability – Per-pin resource providing, SMU:200V max 1A max, PGU: ±20V
  • Configurable Pin number – Maximum 48 Pin full kelvin
  • High precision – The accuracy down to 1pA, system leakage current <500fA, Extremely low current measurement
  • SECS/GEM compliance – Easy integration to customer EAP or factory automation
  • Built-in Maintenance software – CAL/DIAG/PV, Fast troubleshooting and diagnostic of hardware problem, timely guarantee of tester performance
  • Compatible with 48pin – 48pin 230mm-diamter probe card, Protect customer investment on probe card, low migration cost to new tester
  • Compatible with mainstream probers –TEL P8XL/P12/P12XL/Precio XL, TSK UF200/UF3000/UF3000EX, etc.

System Configuration

# Category Sub-Category Description
1 System Cabinet Cabinet Rack, EMO

Power Supply and Distribution Unit

Controller Win10 Workstation,

ptSEMIGHT software suites

LCR Optional

1fF~100nF range

Frequency:1KHz~1MHz

DMM Optional

7 ½ display resolution

Signal Analyzer Optional

9K~10M frequency range

PXIe Chassis Optional

For external HV-SPGU

Semiconductor Pulse Generator  

Optional(S3023P)

±40V(Open), ±20V(50Ω)

 

2 Test Head Mainframe Configurable pins
Pin Board Semight S2018G:

Per-pin SMU: ±200V, ±1A, 100nV/1fA

Per-pin PGU: ±20V(Open), ±10V(50Ω)

Aux port Default configuration:

8 BCN Port for external Instrument

System Functionality

Application
Inline E-test, BEOL WAT, WLR for advanced process
Test Items (typical)
IV/CV Id-Vd,Id-Vg,Vth,BV,Ig,Ioff,Gm
MIM_CAP,C & G
Ic-Vc,BETA,BV
Ron,R_tlm,Rsh_van
Spot,Sweep,Search
Kelvin & Non-Kelvin
Differential Voltage
Frequency Ring Oscillator Frequency
Reliability HCI,NBTI/PBTI,TDDB, etc.
DC
Resource Semight Per-pin SMU S2018G
Function Spot, Sweep
S2018G: 1fA to 1A, 100nV to 200V
Capacitance
Resource External LCR
Function C/G
Frequency 1kHz, 10kHz, 100kHz, 1MHz
Range 1fF to 100nF
DC Bias ±40 V
Differential Voltage
Resource External DMM
Range 1µV to 100V
Pulse Generation
Resource Semight Per-pin PGU S2018G
Amplitude ±20V (Open), ±10V(50Ω)
Frequency 0.1Hz to 5MHz
Pulse Width 100ns to (Period – 100ns)
Tr/Tf <100ns (Typ 50ns)
Frequency Measurement
Resource External Signal Analyzer
Frequency Range 9K to 20M Hz