MTP8104
800G Optical Transceiver Tester
Semight MTP8104 is a comprehensive Bit Error Rate Analysis system which integrates multi-channel Bit Error Rate Tester, multi-port MCBs to host optical transceiver, and multi-channel independent temperature control units, making it ideal for mass-produced testing of high-speed 400G/800G optical transceiver across various ambient thermal cycle settings.
- Wide Rate Range & Exceptional Performance – Rate support range: 24.33-58 Gbaud Independent Control: Each channel can be independently configured with NRZ/PAM4, amplitude and equalization
- Comprehensive Capabilities – Support PCS hardware layer’s FEC error correction analyzer
- High-precision Testing – Support ultra-fast and high-precision BER sampling (<10ms)
Support MSA standard test - Rich test patterns – PRBS7~31Q; SSPRQ /JP03A /JP03B /LIN /Square Wave/Custom Defined Patterns, etc
- Excellent Signal Quality – Rapid rise and fall time low intrinsic jitter
- Humanized Design – MCB connector mating cycles monitoring, CMIS test with multiple hosts
- Cost-effective – Rich Accessories: Low maintenance costs like easy-replaceable, MCBs
Flexible Configuration: Convenient configuration & replacement of accessories, which significantly reduces the overall testing cost - Fully Match ATE Application Scenarios – Support parallel API programmable processing by multiple hosts, Allow Flexible Ber test and temperature control between various channels
Functions and Advantages
Multi-host parallel travel control, more flexible ATE multi-threaded task processing
It supports mixed parallel testing of different types of modules, and supports testing OSFP/QSFP-DD/QSFP112/QSFP56 modules
Scientific design - double-sided TEC+ water cooler to achieve stronger temperature circulation efficiency
Ramp time: ~2 min
Temperature control range: -5°C~ +75°C
Accurate temperature control: ±1°C
Temperature test: DMI temperature of the module
Power consumption of the module under test: 15W/module
Number of modules under test: 4 QSFP-DD modules with parallel temperature control
Integrated optical port error analyzer (BERT), MCB, and TEC temperature cycle control unit
It can be applied to the bit error performance and eye diagram quality test of 400G/800G optical modules in high and low temperature environments.
Support QSFP-DD, OSFP, QSFP112 and other optical module packaging forms
Consumables maintenance – convenient and economical
Motherboard/MCB split design – After the module has reached the end of its plug-in life, only need to remove the MCB separately and replace it.
Plugging and unplugging of optical modules – the system counts in real time and reminds users to pay attention to the life of consumables in time;
Consumables accessories such as TEC/press-knotted box/MCB are designed to be easily disassembled and assembled
| 800G Test Solution | ||
| Model | Dut Type | Dut Amount |
| MTP8104 | 400G/800G OSFP | 4 |
| 400G/800G QSFP-DD | 4 | |
TX specification
| Type | Item | Description |
| Pattern Generator Specification | Output | Differential PAM4/NRZ |
| Dut Amounts | 4 | |
| Terminal | AC Coupling | |
| output Impedance | 100 Ω ± 10% | |
| Pattern | PRBS 7/9/11/13/15/23/31, PRBS7~31Q；
SSPRQ，JP03A，JP03B，LIN，Square Wave，Custom Defined Pattern, etc.； |
|
| Symbol Data Rate [1] (Gbaud) | 24.33/24.8832/25/25.78125/26.5625/27.89/27.95/28.05/28.125 /28.2/28.9/48.66/49.7664/51.5625/53.125/56/56.25/56.4/57.8/58 |
|
| Frequence Accuracy | ±50 ppm (typical) | |
| Output Amplitude (Differential) | 750 mVp-p (typical) [2] | |
| Rise Time [3] (20–80%) | <10 ps (typical) | |
| Fall Time [3] (20–80%) | <10 ps (typical) | |
| Random Jitter [4] | <350 fs (typical) | |
| Trigger and Clock Specification | Clock Output Amplitude | >300 mVp-p |
| Output Type | AC Coupled，Single-end | |
| Div Ratio (Adjustable) | 4/8/16/32 | |
| Trigger Output | Built-in RF Switch to switch clock output |
[1]Option can be added to support expansion the rates <48G.
[2]Net measurement value at the transmitter’s end, default pre-emphasis/de-emphasis parameters.
[3]Tested with 53.125 Gbps NRZ signal.
[4]Tested with/after Jitter separation.
RX specification
| Type | Item | Description |
| Error Detector Specification | Input | Differential PAM4 /NRZ |
| Terminal | AC Coupled | |
| Input Impedance | 100 Ω ±10% | |
| Input Range (Differential) [1] | 150 ~ 750 mVp-p (typical) | |
| RSSI (Differential) [1] | 150 mVp-p (typical) | |
| Pattern | PRBS 7/9/11/13/15/23/31，PRBS7~31Q； | |
| Symbol Rate (Gbaud) [2] | 24.33/24.8832/25/25.78125/26.5625/27.89/27.95/28.05/28.125 /28.2/28.9/48.66/49.7664/51.5625/53.125/56/56.25/56.4/57.8/58 |
|
| Clock Mode | Built-in Clock Recovery | |
| Sync | Auto Sync (Level/Phase) |
[1]Take care of output amplitude from DUT as the high voltage signal may damage the receiver.
[2]Option can be added to support expansion the rates <48G.
Optical transceiver testing specification
| Type | Item | Description |
| TC Specification [1][2] | TC Mode | Contact TEC temperature control |
| TC Range | -5 ~＋85 ℃ [3] | |
| Stability | ±1 ℃ [4] | |
| Accuracy | ±0.1 ℃ | |
| Vcc Bias Tuner | BIAS Range | 3.069～3.5 V |
| Step | 1 mV |
[1]The TC efficiency might fluctuate due to factors such as the ambient temperature, the power consumption of various transceivers, the location of heat sources, and the output power of the chiller.
[2]Due to condensation by long-term low temperature use, the inner space should be circulated with dry and clean air, and periodically heated for drying.
[3]Test environment: Room temperature of 25℃, 15W module placed in a closed space to reduce heat exchange with outside; Feedbacked by DMI temperature.
[4]Perform repeat measurements of the temperature difference between the set temperature and case temperature.