PLR0010

Package-Level Reliability Test Equipment

The Semight PLR0010 package-level reliability test equipment is a reliability test system developed based on the JEDEC reliability test standards. It is mainly used for testing functions such as TDDB (Time-Dependent Dielectric Breakdown), HCI (Hot Carrier Injection), NBTI (Negative Bias Temperature Instability), and EM (Electromigration). The test system can reach temperatures up to 250℃ and utilizes algorithm models to analyze data, enabling the analysis of process defects. Each channel of the system is equipped with independent overcurrent protection to ensure the safety of the devices under test (DUT). Additionally, it can interface with the customer’s EAP system for production data management, facilitating in-depth performance analysis and quality control.

  • Multi-test mode – Supports TDDB/HCI/NBTI/EM test modes;Compliant with JEDEC device reliability testing standards
  • Using the Micro Oven architecture – High temperatures up to four zones,Each oven can independently control temperature up to 250°C
  • High number of concurrent measurements – Capable of testing up to 960 DUTs simultaneously
  • Supports high voltage testing – Power supply can support up to 3500V
  • Support On-the-fly – Supports on-the-fly testing and data analysis
  • Self-developed software testing platform – Using Semight PLR software test platform, the test curve can be presented in real time, and the data output format can be customized according to user needs.
  • Self-developed SMU – Adopt Semight high-precision source meter

Technical Specifications

Parameter Description
Operating Temperature 15℃~55℃
Storage Temperature -10℃~50℃
Operating Humidity 40~60%
Storage Humidity <90%(non-condensing)
Operating Altitude 0~2000m
Power Supply AC380V 3P+N+PE, 19.1A/50/60Hz &12KW
EMC Comply to EU EMC Standards
Safety Comply to EU Safety Standards
Certification Comply to CE or Semi S2 certification
Software System Linux
Programming C#/C++
Software Features Test plan creation and setup, data display and analysis, MES interface, user access control, calibration and maintenance, fault diagnosis