SV1D-14 Direct Attach SerDes Test Module
The SV1D-14 Direct Attach SerDes Test Module from Introspect Technology is a highly integrated, compact testing solution designed for direct mounting on application or test boards, eliminating the need for external cabling. Engineered for high-speed, multi-site SerDes testing, it supports continuous data rate selection up to 14.1 Gbps and features eight independent transmitters and receivers.
Each transmitter includes signal impairments such as sinusoidal and random jitter injection, TX de-emphasis, and lane-to-lane UI and sub-UI skew injection. The receivers provide per-channel equalization, true parallel bit-error-rate measurement, and controls for rapid eye-margining analysis. With built-in power sequencers and clock synthesizers, the SV1D-14 is a fully self-contained test module that minimizes I/O requirements and test time through its built-in scripting capabilities. It communicates effortlessly with ATE systems via an SPI bus and supports an optional parallel interface for extended data transfers, making it an ideal solution for high-throughput, automated SerDes testing environments.
- Multi-site, fully parallel test capability with individual pattern and BER control per lane
- Self-contained solution with on-board power sequencers and clock synthesizers
- Automated with built-in scripting capability for test time minimization
- Tiny footprint and minimal I/O requirements
The SV1D-14 Direct Attach SerDes Test Module is a highly integrated tester that mounts directly on an application or test board without requiring cables. It satisfies the growing need for parallel, multi-site Gbps testing methodologies at the lowest possible total cost.
The SV1D-14 provides continuous data rate selection up to 14.1 Gbps. It features 8 independent transmitters with signal impairments including sinusoidal and random jitter injection, TX de-emphasis and lane-to-lane UI and sub-UI skew injection. It features 8 independent receivers with per-channel equalization, true parallel bit-error-rate measurement and controls for rapid eye-margining measurement. Communication with ATE is handled seamlessly via an SPI bus and via an optional parallel interface for extended data transfers.
SV1D MIPI D-PHY Interoperability
