SV3D-4
The SV3D-4 Direct Attach SerDes Test Module is a compact, highly integrated solution designed for direct mounting on application or test boards, eliminating the need for cables. It addresses the growing demand for parallel, multi-site Gbps testing at minimal cost. Supporting continuous data rate selection up to 4 Gbps, the SV3D-4 features 32 independent transmitters and 32 independent receivers. These channels are equipped with advanced signal integrity capabilities such as sinusoidal and random jitter injection, TX de-emphasis, lane-to-lane skew injection, per-channel equalization, and true parallel bit-error-rate measurement.
Ideal for high-throughput environments, the module supports fully parallel test operations with individual pattern and BER control per lane. It is a self-contained solution, featuring onboard power sequencers and clock synthesizers, and is automation-ready with built-in scripting for reduced test time. With a tiny footprint and minimal I/O requirements, the SV3D-4 ensures efficient integration into existing ATE setups via SPI communication and an optional parallel interface for high-speed data transfers.
- Multi-site, fully parallel test capability with individual pattern and BER control per lane
- Self-contained solution with on-board power sequencers and clock synthesizers
- Automated with built-in scripting capability for test time minimization
- Tiny footprint and minimal I/O requirements
The SV3D-4 Direct Attach SerDes Test Module is highly-integrated tester that mounts directly on an application or test board without requiring cables. It satisfies the growing need for parallel, multi-site Gbps testing methodologies at the lowest possible total cost.
The SV3D-4 provides continuous data rate selection up to 4 Gbps. It features 32 independent transmitters with signal impairments including sinusoidal and random jitter injection, TX de-emphasis and lane-to-lane skew injection, and 32 independent receivers with per-channel equalization, true parallel bit-error-rate measurement and controls for rapid eye-margining measurement. Communication with ATE is handled seamlessly via an SPI bus and via an optional parallel interface for extended data transfers.