IP1000 High Precision Open/Short Tester for FCBGA Packages
IP1000
IP1000
Package Size: 11×11 ~ 55mmx55mm
Product Type: FCBGA
Application: After wire bonding open short tester
The IP1000 is an advanced testing solution engineered to detect open and short circuits with exceptional accuracy in semiconductor devices, specifically Flip-Chip Ball Grid Array (FCBGA) packages. Designed to meet the rigorous demands of modern semiconductor manufacturing, the IP1000 offers high-speed testing capabilities, superior signal integrity, and robust support for fine-pitch, high-density interconnects typical in FCBGA designs. Its precision measurement system ensures reliable defect detection at micron-level resolutions, making it an essential tool for quality assurance and process control in high-performance IC production.
♦ Using smart open short to test the system, Standard I/O 1024 Pin
♦ The height of the test machine can be expanded to 2048 pin
♦ Test speed per pin 2ms
♦ Single-channel dual-zone test, channel width Max. 70mm
♦ Minimum test solder ball pitch 0.8mm
♦ With defective product re-test function
♦ Defective products are marked in the form of a map
♦ Max. UPH 1.2K
♦ Use Load board to test